基于ATE的高速高精度ADC测试方法  

Test method of high-speed and high-precision ADCs based on ATE system

作　　者：刘雨涛 郭晓宇[1] 韩先虎 王建超[1] LIU Yutao;GUO Xiaoyu;HAN Xianhu;WANG Jianchao(The 58^(th) Research Institute,CETC,Wuxi 214000,China)

机构地区：[1]中国电子科技集团公司第五十八研究所,江苏无锡214000

出　　处：《中国测试》2023年第S01期121-124,共4页China Measurement & Test

摘　　要：目前高速高精度的ADC在通信技术,雷达技术等领域得到广泛应用。传统ADC测试方法使用ATE测试机台提供生产测试,ATE板卡提供的时钟源和信号已无法满足此类ADC的测试需求。通过分析时钟抖动和相位抖动对ADC参数的影响估算测试性能,同时给出基于ATE的高速高精度ADC测试方法,使用更小相位抖动的时钟信号和更小相位噪声的信号源作为模拟输入,并使用加窗算法解决频谱泄露,大幅提高高速高精度的ADC动态参数的测试精度。以AD9268为例,使用该文基于ATE的测试方法,可实现125 MS/s采样率下达到16位ADC动态参数典型值的测试需求。At present,high-speed and high-precision ADCs are widely used in communication and radar technology.The traditional ADC test method uses the ATE test machine to provide production test.The clock source and signal provided by the ATE board can no longer meet the test requirements of high-speed and high-precision ADCs.By analyzing the impact of clock jitter and phase jitter on ADC parameters,the test result is estimated.A high-speed and high-precision ADC test method based on ATE is studied in this paper.The clock signal with smaller phase jitter and the signal source with smaller phase noise are used,and the windowing algorithm is used to solve the spectrum leakage.This method improves test accuracy of the dynamic performance of the high-speed and high-precision ADC.Taking AD9268 as an example,using the ATE-based mass production test method in this paper,the test requirements of typical values of 16-bit ADC dynamic parameters at a sampling rate of 125 MS/s can be achieved.

关 键 词：ATE 模数转换器 信噪比 抖动 相位噪声 

分 类 号：TN792[电子电信—电路与系统]