半导体光电器件标准化现状分析  

Analysis of the Standardization of Semiconductor Optoelectronic Devices

作　　者：刘秀娟[1] 程骥 吴杜雄 LIU Xiu-juan;CHENG Ji;WU Du-xiong(China Electronics Standardization Institute;Chengdu Vistar Optoelectronics Co.,Ltd.;CESI(Guangzhou)Standards&Testing Institute Co.,Ltd.)

机构地区：[1]中国电子技术标准化研究院 [2]成都辰显光电有限公司 [3]广州赛西标准检测研究院有限公司

出　　处：《标准科学》2022年第S01期59-63,共5页Standard Science

摘　　要：本文介绍半导体光电器件领域的国际及国内标准化情况,重点介绍近期由我国牵头制定的1项微型发光二极管阵列测试方法国际提案的背景、过程以及主要内容,为半导体光电器件领域的国际标准化工作奠定基础。This paper introduces the international and domestic standardization in the field of semiconductor optoelectronic devices,as well as the background,process,main content and significance of an international standard proposal on the measuring method of micro LED recently formulated by China,so as to lay a foundation for the international standardization work in the field of semiconductor optoelectronic devices.

关 键 词：半导体光电器件 发光二极管 测试方法 标准化 国际提案 

分 类 号：TN36[电子电信—物理电子学]