数字T/R多组件并行测试系统的设计  

Design of Parallel Test System for Digital T/R Modules

作　　者：徐欣欢[1] 夏松林 陈兆国[1] Xu Xinhuan;Xia Songlin;Chen Zhaoguo(Nanjing Research Institute of Electronics Technology,Nanjing Jiangsu,210039)

机构地区：[1]南京电子技术研究所,江苏南京210039

出　　处：《电子测试》2022年第24期101-103,115,共4页Electronic Test

摘　　要：本文阐述了数字T/R组件的基本工作原理,在原有单组件测试系统基础上,提出一种改进的数字T/R组件并行测试方案,通过共享或增加部分关键仪表资源、软件多线程测试等方式实现多个组件的同时测试,并搭建了某型数字T/R组件双组件并行测试系统,使测试效率得到大幅提升,提升了仪表资源的利用率。This paper describes the basic working principle of digital T/R module,based on the original single component test system,an improved parallel testing scheme for digital T/R components is proposed,by sharing or adding some key instrument resources、simultaneous testing of multiple components by means of software multithreading testing,and built a dual component parallel test system for a digital T/R component,greatly improve the test efficiency,improved utilization of instrument resources.

关 键 词：数字T/R组件 并行 测试系统 

分 类 号：TN957[电子电信—信号与信息处理]