有机晶体缺陷的研究进展  

Progress on Defects in Organic Crystal

作　　者：于增瑞 王永莉[1] 周靖 周丽娜[1] Yu Zengrui;Wang Yongli;Zhou Jing;Zhou Lina(School of Chemical Engineering and Technology,Tianjin University,Tianjin 300072,China)

机构地区：[1]天津大学化工学院,天津300072

出　　处：《化学工业与工程》2020年第2期19-29,共11页Chemical Industry and Engineering

基　　金：国家自然科学基金(NNSFC21706183)。

摘　　要：有机晶体存在裂纹、包裹体、位错和孔洞等缺陷,常引起杂质包藏、产品质量下降、光学和机械性能降低等问题。含有大量缺陷的晶体在产品后处理阶段和使用阶段均面临诸多困难,近年来已成为晶体学研究学者们关注的热点。针对在有机晶体缺陷研究中尚无综合性的报导,阐述了晶体缺陷的类型与形成机理,详细讨论了晶体缺陷的检测方法和表征手段,综述了减少有机晶体缺陷形成的调控手段以及晶体缺陷和晶体形态调控方法在炸药、非线性光学材料、半导体材料晶体性能改进等方面的应用。Crystal defects such as cracks,inclusions,dislocations and voids in organic crystal caused impurity occlusion,product quality degradation,and reduced optical and mechanical properties. Crystals that contained a large number of defects faced many difficulties in both the post-processing stage and inservice stage of the product. In recent years,it has become a hot spot for researchers of crystallography.In view of the lack of comprehensive reports on the investigation of organic crystal defects,the formation mechanism and types of crystal defects are described. The detection methods and characterization methods of crystal defects are discussed in detail. The regulation methods for reducing the formation of organic crystal defects are reviewed. The application of crystal defects and crystal morphology control methods in explosives,nonlinear optical materials,and crystal properties improvement of semiconductor materials are summarized.

关 键 词：有机晶体 晶体缺陷 结构表征 缺陷机理 

分 类 号：O77[理学—晶体学]