基于V93000 MTP的存储器测试  

Research on Memory Test Based on the V93000 MTP

作　　者：陈鄞琛 贺云 CHEN Yinchen;HE Yun(CEPREI,Guangzhou 511370,China)

机构地区：[1]工业和信息化部电子第五研究所电子元器件应用验证中心,广东广州511370

出　　处：《电子产品可靠性与环境试验》2022年第S01期80-84,共5页Electronic Product Reliability and Environmental Testing

摘　　要：随着存储器的不断发展,实现存储器全地址多功能测试所需要的向量深度也迅速地变大,有些甚至已经超出了测试系统本身存储容量的限制,因此,如何压缩测试向量变得至关重要。与基于硬件APG的传统存储器测试方法相比,MTP软件包作为V93000系统推出的内存测试解决方案,具备设置灵活、占内存小、实现方便、可与传统的测试向量共同使用等特点。首先,着重地分析了MTP的特点;然后,详细地介绍了MTL文件的构成;最后,以DDR3器件的测试为例,阐述了存储器测试过程中利用MTP生成测试向量的方法,从而高效、简便地完成了存储器的测试评价。With the continuous development of memory,the vector depth required to realize the full-address multi-function test of the memory is also rapidly increasing,and some of them have even exceeded the limit of the storage capacity of the test system itself.Therefore,how to compress the test vector becomes very important.Compared with the traditional memory test method based on hardware APG,the MTP software package,as a memory test solution introduced by the V93000 system,has the characteristics of flexible setting,small memory occupation,convenient implementation,and compatibility with traditional test vectors.Firstly,the characteristics of MTP are analyzed emphatically.Then,the composition of the MTL files is introduced in detail.Finally,taking the test of DDR3 devices as an example,the method of generating test vectors by MTP in the memory test process is described,thereby efficiently and easily completing the memory test and evaluation.

关 键 词：存储器测试 测试向量 测试软件 测试语言 

分 类 号：TP333[自动化与计算机技术—计算机系统结构]