FPGA集成FIFO在高过载存储测试系统中的应用  

Application of FIFO integrated by FPGA in high overload storage measurement system

作　　者：马游春[1] 张涛[1] 李锦明[1] 

机构地区：[1]仪器科学与动态测试教育部重点实验室中北大学电子科学与技术系,太原030051

出　　处：《仪器仪表学报》2006年第z3期2350-2351,2388,共3页Chinese Journal of Scientific Instrument

基　　金：国家自然科学基金资助项目(50375050)

摘　　要：本文主要利用XILINX公司的FPGA芯片XC2S30内部的双口RAM来集成FIFO,并根据两种不同的三星公司FLASH存储器页编程缓冲寄存器容量,设计了两种不同的FIFO缓冲高过载存储测试解决方案,从而最大限度地利用了FPGA的内部资源,文中还给出了测试系统总体框图及应用情况。According to two kinds of page program registers of FLASH memory provied by Samsung, this paper researches about two different FIFO buffering ways in some high overload storage and measurent system. The FIFO used here is integrated by xc2s30 FPGA chip provided by XILINX company. So we can use the IP resouce of FPGA in large. The measurement hardware theory and application of the system had also been presented.

关 键 词：高过载 存储测试 数据缓存 可编程器件 闪存 

分 类 号：TH7-55[机械工程—仪器科学与技术]