涡流检测探头提离变化对阻抗的影响及消除技术  

Impedance Variations Caused by Probe Coil Lift-off and Elimination Technique in Eddy Current Testing

作　　者：叶波[1] 黄平捷[1] 周泽魁[1] 

机构地区：[1]浙江大学控制科学与工程学系,杭州310027

出　　处：《仪器仪表学报》2005年第z2期732-734,737,共4页Chinese Journal of Scientific Instrument

摘　　要：简要介绍了涡流检测的基本原理和涡流探头的特性;分析和研究了涡流检测探头提离变化对阻抗的影响;针对单层金属板厚度的电涡流检测,根据仿真结果,提出了优选激励频率消除探头提离影响的新方法。对于非接触式单层板厚度涡流检测的研究与应用,具有重要参考价值。The basic principle of eddy current testing is introduced and the coil impedance responses due to the variations of the probe coil lift-off are analyzed and studied. Aim at the eddy current testing of single thickness, a new method to eliminate the disturbance of coil impedance caused by the lift-off is presented based on the simulation results.

关 键 词：涡流检测 探头 提离 阻抗变化 消除 

分 类 号：TH7-55[机械工程—仪器科学与技术]