基于红外成像法的低压电器故障检测研究  

Research of Fault Test for Low Voltage Electrical Apparatus Based on Infrared Image Technology

作　　者：王彦霞[1] 王震洲[1] 刘教民[1] 

机构地区：[1]河北科技大学信息学院,河北石家庄050018

出　　处：《低压电器》2008年第15期50-53,共4页Low Voltage Apparatus

基　　金：国家自然科学基金资助项目(60675014)

摘　　要：在阐述红外热像测温原理的基础上,推导出实际应用中各种条件下计算被测表面真实温度的通用计算公式,由此得到两点之间真实的温度差,进一步推导出相对温差法的计算公式,并结合实际介绍了红外热成像技术在低压电器故障检测上的一些应用。Based on the principle of infrared radiation,the formulas of the real temperature calculation of a target surface under various conditions were derived.Thereby the real difference in temperature between two points was obtained,so that formula of the relative temperature difference was derived.And some applications of infrared imaging technique in the test of the fault of low-voltage apparatus were introduced.

关 键 词：红外诊断 测温原理 相对温差 断路器 

分 类 号：TM52[电气工程—电器]