恒流电晕充电对ETFE驻极体驻极态的影响  

Influence of Constant-Current Corona Charging on Electret-Sstate of ETFE Electrets

作　　者：沈莉莉[1] 夏钟福[1] 冀忠宝[1] 朱建伟[1] 

机构地区：[1]同济大学波耳固体物理研究所,上海200092

出　　处：《四川大学学报（自然科学版）》2005年第S1期172-174,共3页Journal of Sichuan University(Natural Science Edition)

摘　　要：作者利用常温恒流和恒压电晕充电及充电后的等温表面电位衰减测量、热刺激放电(Thermally Sti mulated Discharge,TSD)电流谱分析和热脉冲技术对电荷重心的测量和分析等方法,研究了以恒流和恒压电晕充电形成ETFE驻极体对其驻极态的影响.结果说明与恒压电晕充电相比较,恒流电晕充电时由于流过薄膜体内的电流恒定,可增加注入电荷在体内能阱被捕获的概率,致使薄膜体内沉积电荷密度上升,能改善驻极体的储电能力.The influence of constant-current and constant-voltage corona charging technique on the electret state of ETFE film electret has been studied by two kinds of the charging technique at room temperature (RT), isothermal surface potential decay measurements, TSD(thermally stimulated discharge) current spectrum analyses and thermal pulse technique etc. Compared with the constant-voltage corona charging, the current through the film is constant during the charging, therefore, the possibility of trapping charges ...

关 键 词：恒流电晕充电 ETFE 驻极体 电荷稳定性 

分 类 号：O484.4[理学—固体物理]