铁电畴的扫描探针声学显微术  

Scanning Probe Acoustic Microscopy of Ferroelectrics

作　　者：余寒峰[1] 殷庆瑞[1] 

机构地区：[1]中国科学院上海硅酸盐研究所高性能陶瓷和超微结构国家重点实验室,上海200050

出　　处：《四川大学学报（自然科学版）》2005年第S1期105-107,共3页Journal of Sichuan University(Natural Science Edition)

基　　金：国家重点基础研究发展规划项目(2002CB613307)

摘　　要：一种新的表征技术——扫描探针声学显微成像技术(Scanning Probe Acooustic Mi-croscopy)已在我们实验室建立起来,可以用它来直接观察PMN-PT弛豫铁电单晶、透明PLZT陶瓷、无铅Bi4(Ti,Nb)3O12陶瓷等材料的纳米极性微区和弹性作用区,并显示了在低频工作状态下可以达到10nm的分辨率.Scanning probe acoustic microscope based on commercial scanning probe microscope was successfully developed. The excitation frequency is in the range of several kHz to decades kHz, which is much lower than that of the conventional acoustic imaging techniques. It has been used for imaging the doamian structures and elasticities of PMN-PT crystal, transparent PLZT ceramics and lead-free Nb-doped Bi_ 4 Ti_ 3 O_ 12 ceramics. The results show the resolution of the sanning probe acoustic microscopy is down to ～10...

关 键 词：扫描探针 声学显微术 铁电畴 

分 类 号：TH742[机械工程—光学工程]