混合信号集成电路测试中的约束条件分析  

Constraint Analysis for Mixed-signal Integrated Circuit Testing

作　　者：孙秀斌[1] 陈光(礻禹)[1] 

机构地区：[1]电子科技大学自动化工程学院,成都610054

出　　处：《仪器仪表学报》2003年第z2期68-69,共2页Chinese Journal of Scientific Instrument

摘　　要：对于混合信号集成电路来说,其模拟和数字部分之间存在相互关联,如模拟输出控制数字输入。为了测试出电路中的呆滞型故障,需要考虑对模拟输入的约束要求。本文根据被测电路的测试矢量集,分析混合信号集成电路测试中所需的限制条件并给出相应的模拟激励。For mixed-signal integrated circuits,there exists dependency between their analog and digital blocks, for example controlling digital inputs from analog outputs. The constraints imposed on analog inputs should be taken into consideration to test the stuck-at faults of the circuits. In this paper,the conditions needed for mixed- signal integrated circuit testing are analyzed and corresponding analog stimulus is given based on test vector sets of the circuit under test.

关 键 词：混合信号集成电路 测试矢量 约 束 

分 类 号：TN4[电子电信—微电子学与固体电子学]