圆形标志点的亚像素定位及其应用  

Sub-pixel location of circle target and its application

作　　者：殷永凯[1] 刘晓利[1] 李阿蒙[1] 彭翔[1] 

机构地区：[1]深圳大学光电工程学院,广东深圳518060

出　　处：《红外与激光工程》2008年第S1期47-50,共4页Infrared and Laser Engineering

基　　金：国家自然科学基金(69875013;60275012;60775021);广东省自然科学基金(031804);深圳市科技计划(200341)资助项目

摘　　要：标志点定位是三维形貌测量的关键技术之一,其精度在很大程度上决定着系统的测量精度。其中,圆形标志点以其定位精度高、易于识别的优点得到了广泛的应用。结合Canny边缘检测、目标识别、亚像素边缘检测等技术,提出了一种可用于对复杂背景下的圆形标志点进行亚像素定位的方法。仿真实验证明该方法可以保证0.02像素的定位精度。随后,给出了一种利用圆形标志点进行深度像匹配的实例。Target location is a crucial part of 3D shape measurement, because it determines the measuring precision of system to a great extent. The target with circle is applied widely, because of its advantages of high location precision and easily being recognized. In this paper, a method of sub-pixel circle target location with complex background was proposed. Many techniques were used, such as Canny edge detection, target recognition, sub-pixel edge detection etc. Simulation experiment proves that the location un...

关 键 词：标志点 亚像素 深度像匹配 三维形貌测量 

分 类 号：TP391.41[自动化与计算机技术—计算机应用技术]