激光辐照单晶硅生成低维纳米结构及其Raman光谱分析  

RAMAN SPECTRA ANALYSIS OF LOW-DIMENSIONAL NANOSTRUCTURE FORMED BY LASER IRRADIATION ON SILICON

作　　者：金锋[1] 王海旭[1] 黄伟其[1,2] 崔朝龙[1] 刘世容[3] 秦朝建[3] 

机构地区：[1]贵州大学光电子技术与应用实验室,贵阳550025 [2]贵州教育学院物理系,贵阳550003 [3]中国科学院地球化学研究所,贵阳550003

出　　处：《贵州科学》2008年第3期12-15,共4页Guizhou Science

基　　金：国家自然科学基金资助项目(10547006);贵州大学SRT项目

摘　　要：用激光辐照法加工单晶硅样品而生成的低维结构具有较高稳定性及较强光致荧光(PL)谱峰等特点.进一步分析样品的拉曼光谱峰位频移及半高宽变化,对其纳米结构的尺寸进行了表征和指认.The low-dimensional nanostructure formed by laser irradiation on silicon sample is more stable and has stronger PL peak than the samples formed by other methods.The relation between the sizes of nanostructures and the deviation of Raman peaks has been studied.The calculation results show good agreement with the experiments.

关 键 词：激光辐照 纳米结构 拉曼光谱 

分 类 号：O432.12[机械工程—光学工程]