基于电子探针背景的精细测量方法  

Accurate background measurement on electron probe

作　　者：姚立[1,2] 田地[1] 姚杰[2] 

机构地区：[1]吉林大学仪器科学与电气工程学院,长春130061 [2]吉林大学测试科学实验中心,长春130022

出　　处：《吉林大学学报（工学版）》2009年第1期240-243,共4页Journal of Jilin University:Engineering and Technology Edition

基　　金：国家科技基础条件平台建设项目(2004DKA10010)

摘　　要：由于X射线谱线的背景干扰和曲率变化,使得电子探针定量分析会产生误差,且元素质量分数越低误差越显著。为准确测量和扣除X射线谱线背景,研究了谱线背景的测量和扣除方法,并设计了相应控制测量软件。首先通过完善的元素特征X射线波长数据库判断出测量元素的背景干扰情况,对有干扰或有曲率变化的谱线背景进行多点精细测量,再采用线性或多项式拟合方法计算扣除背景。对标准样品III-HN8520和I-E078l进行了测试,结果表明,该方法比原方法降低了谱线干扰,提高了定量分析数据的准确性。Due to the existence of interference and non-linear background in X-ray spectrum,there are errors in the results of quantitative analysis on electron probe,especially for the lower element content.In order to measure and deduct the Xray background intensity exactly,the background measurement and deduction method was investigated and corresponding software of control and measurement was designed.It was combined with several methods,including determining the interference through the characteristic X-ray spect...

关 键 词：地质学 精细测量 曲线拟合 电子探针背景 

分 类 号：P575.1[天文地球—矿物学]