基于任务剖面关键度划分的嵌入式软件可靠性增长模型  

Software reliability growth model based on criticality partition of functional profile for embedded software

作　　者：王金波[1,2] 赵光恒[1] 陈蔚薇[1] 

机构地区：[1]中国科学院光电研究院,北京100080 [2]中国科学院研究生院,北京100080

出　　处：《吉林大学学报（工学版）》2009年第2期436-439,共4页Journal of Jilin University:Engineering and Technology Edition

基　　金：国家自然科学基金项目(10603005);中国科学院国防科技创新基金项目(Cxjj-200)

摘　　要：以任务剖面的关键度划分为出发点,考虑测试的有效性,建立一种随测试覆盖率变化的嵌入式软件可靠性增长模型,改变了以往模型中可靠性提高单纯依靠测试时间增长以及可靠度结果虚高等不足。提出在测试成本一定的情况下对软件进行可靠性增长测试时,关键度较高的任务剖面应该获得较多的测试工作投入,即获得较高的测试覆盖率。Starting with the criticality partition of functional profiles(FPs) and considering the test-effectiveness,a new software reliability growth model suitable for embedded software is proposed based on the logarithmic model.This model takes the cost-constraint into consideration in software reliability growth test.It gives higher test coverage to the FPs with higher criticality.Compared with existing models this growth model has two features.First,it does no longer take time as the only variable to increase th...

关 键 词：计算机软件 软件可靠性 对数模型 测试剖面 测试覆盖率 关键度 可靠性增长模型 

分 类 号：TP311.52[自动化与计算机技术—计算机软件与理论]