一种新型共轭聚合物发光二极管老化的拉曼光谱研究  

Study on the Degradation of Polymer Light-Emitting Diodes by In-Situ Micro-Raman Spectroscopy

作　　者：林海波[1] 徐晓轩[1] 吴宏滨[2] 武中臣[1] 俞钢[3] 许京军[1] 张存洲[1] 

机构地区：[1]南开大学物理科学学院光子学中心,天津300071 [2]华南理工大学材料学院高分子光电材料及器件研究所,广东广州510640 [3]美国Dupont Displays,南开大学讲座教授天津300071

出　　处：《光谱学与光谱分析》2004年第6期701-703,共3页Spectroscopy and Spectral Analysis

基　　金：国家教育部振兴计划项目资助

摘　　要：通过显微共焦拉曼光谱 ,对一种以新型的共轭聚合物半导体材料 3,4 (2 乙基己氧基 )苯基 1,3 丙二醇酯 (poly(2 (4 Ethylhexyl) phenyl 1,4 phenylenevinylene) (P PPV) )为发光层的聚合物发光二极管(PLEDs)器件进行了老化研究 ,无论是光致发光光谱还是拉曼光谱都提供证据说明造成器件老化的原因主要是发光层的聚合物的主链结构 ,即聚合物的共轭结构被破坏 ,这对提高以P PPV作为发光层的PLEDs器件的性能提出有用信息。The authors report Raman degradation study of polymer light-emitting devices under ambient conditions. In order to investigate the chemical degradation reaction in polymer light-emitting diode (PLEDs) devices, the chemical structure of the poly (2(4-Ethylhexyl) phenyl-1, 4-phenylene vinylene) (P-PPV) polymer was analyzed by micro-Ramam spectroscopy during the lifetime of the devices. The evidence for the reduction of conjugation length is provided by Raman spectroscopy. This reduction of the conjugation length, which dramatically increases the resistance and cuts off the current density, was the main reason for the failure of lighting. These findings provide an important insight into the intrinsic degradation mechanisms of the polymer LEDs and help in the development of even more stable devices.

关 键 词：共轭聚合物 发光二极管 器件老化 拉曼光谱 共轭结构 电致发光 

分 类 号：TN312.8[电子电信—物理电子学] TN383.1