制冷型红外探测器组件降温时间的影响因素  

Factors affecting cool-down time of cooled IR detectors

作　　者：刘刚[1] 刘建伟[1] 杨桂兰[1] 于婷婷[1] 杨家艾[1] 

机构地区：[1]华北光电技术研究所,北京100015

出　　处：《红外与激光工程》2006年第z5期203-208,共6页Infrared and Laser Engineering

摘　　要：以工作物质的一定压力、温度为基准状态,定义了组件热容量影响系数、工质状态(压力/温度)影响系数、流量影响系数等参数,为红外探测器组件的降温时间计算建立理论模型,用该模型计算分析了高温环境下组件的热容量和工质制冷量的变化对降温时间的影响,并和实验结果进行了比较。另外分析了实际情况小幅偏离基准状态对实验结果的影响。The specific heat,cryogen state(pressure/temperature) and flow rate coefficient on cool-down time of IR detectors are defined based on specified cryogen state.A theoretic cool-down time model of IR detector assembly is established.With this model,the effects,that influenced by the specific heat of detector assembly and cryogen refrigeration power,to the cool-down time are calculated and analyzed.The calculation is compared with the experiment results.On the other hand,the effect of differential bias to the standard state is analyzed.

关 键 词：制冷 降温时间 焓差 环境温度效应 

分 类 号：TB69[一般工业技术—制冷工程]