CMOS读出电路中的噪声及抑制  

Fixed Pattern Noise and Its Suppression in CMOS ROIC

作　　者：刘成康[1] 袁祥辉[1] 张晓飞[1] 

机构地区：[1]重庆大学光电工程学院,重庆400044

出　　处：《半导体光电》2002年第3期170-173,共4页Semiconductor Optoelectronics

摘　　要：CMOS读出电路中的噪声严重地制约了读出电路的动态范围 ,进而影响到焦平面阵列甚至成像系统的性能。文章对读出电路中KTC噪声、1/ f噪声以及固定图形噪声的成因及抑制技术进行了分析和讨论 。The dynamic range of ROIC is seriously restrained by various noises in CMOS ROIC, and the performance of FPA, even the performance of imaging system, are affected by these noises. The causes and suppression techniques of KTC noise, 1/ f noise and fixed pattern noise in ROIC are analyzed, and the simulated results are given.

关 键 词：KTC噪声 1/f噪声 固定图形噪声 CMOS读出电路 相关双采样 

分 类 号：TN792[电子电信—电路与系统]