一种改进的全数字化锁相环在光栅位置检测中的应用  

Application of Improved ADPLL in Grating Position Measure

作　　者：王小兵[1] 金锋[1] 

机构地区：[1]北京理工大学信息科学技术学院,北京100081

出　　处：《仪器仪表学报》2004年第z3期641-643,共3页Chinese Journal of Scientific Instrument

摘　　要：全数字锁相环(ADPL L)应用广泛,但是在检测领域应用不多。为此,介绍了将一种改进的全数字化锁相环应用于光栅位置检测中的方法。该方法先将光栅传感器的输出信号进行相应调制预处理,再送入全数字锁相环中进行倍频细分,这样既避免了传统锁相环细分方法的缺点,又有细分数高,调节方便,捕捉范围宽的优点。All digital phase locked loop(ADPLL) has wide application, however, it is not usually used in the field of measurement. It introduces a method which applies an improved ADPLL to the position measurement of the grating. First, the displacement signal is translated into time signal; then, through the ADPLL, electronic division is achieved. So, this method avoids the disadvantages of classical method as well as reserves the advantages of high division, wide scope of catch, and easy adjust.

关 键 词：全数字锁相环 光栅 位置检测 

分 类 号：TH7-55[机械工程—仪器科学与技术]