Structure and reflective properties of Al-Cu-Fe quasicrystalline thin film prepared by laser induced arc method  

作　　者：MOU Huiqing SHAO Tianmin SE Dao 

机构地区：[1]State Key Laboratory of Tribology, Tsinghua University, Beijing 100084, China State Key Laboratory of Tribology, Tsinghua University, Beijing 100084, China State Key Laboratory of Tribology, Tsinghua University, Beijing 100084, China

出　　处：《Science China(Physics,Mechanics & Astronomy)》2004年第z1期133-140,共8页中国科学：物理学、力学、天文学（英文版）

基　　金：This work was supported by the National Natural Science Foundation of China(Grant No.50075042);the Key Project of the National Natural Science Foundation of China(Grant No.50135040).

摘　　要：Al-Cu-Fe thin films were prepared by laser induced arc (laser-arc) method from a single source-Al63Cu25Fe12 alloy, which was proved to consist of quasicrystalline phase together with approximant phase. The composition of the deposited films meets the requirement for formation of icosahedral symmetry phase. Quasicrystalline phase was obtained after annealing the amorphous as-deposit film samples. The optical properties of the samples were investigated. Thin film samples of Al, Cu and Fe deposited under the same condition were employed for comparison. The results showed specific reflective properties of Al-Cu-Fe quasicrystal thin film in some wavelength range. The optical conductivity of the films exhibited a negative peak, centered about 440 nm in range of 190to 800 nm. The Al-Cu-Fe quasicrystal thin films could absorb almost all the ray in the wavelength range from 420nm to 450 nm. The ratio of absorption was greater than 99%.Al-Cu-Fe thin films were prepared by laser induced arc (laser-arc) method from a single source-Al63Cu25Fe12 alloy, which was proved to consist of quasicrystalline phase together with approximant phase. The composition of the deposited films meets the requirement for formation of icosahedral symmetry phase. Quasicrystalline phase was obtained after annealing the amorphous as-deposit film samples. The optical properties of the samples were investigated. Thin film samples of Al, Cu and Fe deposited under the same condition were employed for comparison. The results showed specific reflective properties of Al-Cu-Fe quasicrystal thin film in some wavelength range. The optical conductivity of the films exhibited a negative peak, centered about 440 nm in range of 190 to 800 nm. The Al-Cu-Fe quasicrystal thin films could absorb almost all the ray in the wavelength range from 420nm to 450 nm. The ratio of absorption was greater than 99%.

关 键 词：quasicrystal  thin film  REFLECTION ratio  laser-arc. 

分 类 号：N[自然科学总论]