SE同轴测试装置中阶梯电容的研究与优化  

The optimization of step capacitance in SE coaxial testers

作　　者：陈超婵[1,2] 赵吉祥[1] 桑昱[2] 陆福敏[2] 

机构地区：[1]中国计量学院信息工程学院,浙江杭州310018 [2]上海计量测试技术研究院,上海201203

出　　处：《中国计量学院学报》2010年第2期99-103,共5页Journal of China Jiliang University

基　　金：上海市科委资助项目(No.08DZ0501800);浙江省自然基金杰出青年团队项目(No.R105248);国家标准化公益专项项目(No.200810461);国家自然科学基金资助项目(No.10802082);浙江省自然科学基金资助项目(No.Y6090008)

摘　　要：在屏蔽材料的屏蔽效能(shielding effectiveness,SE)测试装置中,通过对锥形连接器内导体进行微小移位,优化固定同轴装置的支撑介质的内、外径比值,并在支撑介质中挖去一定厚度的环形沟道构成小电感等技术对阶梯电容进行补偿,减小由截面不连续引起的回波损耗,设计了频率范围为10 MHz至3 GHz的SE同轴测试装置.利用软件仿真验证了表面电阻为5Ω的屏蔽材料在该装置中测试有稳定的SE值,证明该装置不仅改善了基于ASTM D4935测试装置频率范围窄的不足,同时具备良好的阻抗匹配特性.Tapering transitions were commonly used to connect coaxial fixtures and N-type coaxial interfaces in SE(shielding effectiveness) coaxial testers.Now,it has been optimized by shifting the inner conductors moderately,setting the ratio of inner and outer diameters of the brace mediums,and digging small rings in the brace mediums contact with the air to compensate the step capacitances.An SE coaxial tester with a wider frequency range from 10 MHz to 3 GHz was developed and its stable characteristics were valida...

关 键 词：屏蔽效能 阶梯电容 回波损耗 锥形过渡器 支撑介质 

分 类 号：TN03[电子电信—物理电子学]