“风云二号”卫星天线消旋失锁故障原因初步分析  

Fault analysis of the loss of despun antenna’s lock for FY-2C satellite

作　　者：郑昊[1] 焦维新[1] 魏彩英[2] 

机构地区：[1]北京大学,地球与空间科学学院,北京,100871 [2]国家卫星气象中心,北京,100081

出　　处：《航天器环境工程》2010年第4期424-427,403,共4页Spacecraft Environment Engineering

基　　金：国家自然科学基金资助项目(批准号40674097)

摘　　要：文章针对"风云二号"c(fy-2c)卫星的天线消旋失锁事件,利用卫星数据统计分析了事件与高能电子之间的关系,并利用dictat软件针对常用于卫星的3种电介质材料--聚乙烯、聚四氟乙烯和环氧树脂的平板和圆柱模型分别计算其内部带电所能产生的最大电场.结果表明:fy-2c卫星的天线消旋失锁事件有可能是由高能电子导致的介质深层充电引起.A statistical analysis of the loss of the despun antenna's lock for FY-2C satellite is carried out in this paper,based on the satellite data,to investigate the relationship between these events and high energy electrons.By using DICTAT software,the maximum internal electric field is calculated,which is produced by electrons in planar and cylindrical polythene,teflon and epoxy dielectrics.The results show that the loss of despun antenna's lock for FY-2C satellite is most likely caused by deep dielectric charging due to high energy electrons.

关 键 词：天线消旋 故障分析 高能电子 内部充电 

分 类 号：V520.5[航空宇航科学与技术—人机与环境工程] V443+.4