CCD芯片在I波段未明原因的一种退变(英文)  

UNSOLVED DETERIORATION OF THE CCD CHIP IN I WAVEBAND WITH UNKNOWN CAUSE

作　　者：姚保安[1] 

机构地区：[1]中国科学院上海天文台,上海200030

出　　处：《中国科学院上海天文台年刊》2009年第1期107-113,共7页Annals Shanghai Astronomical Observatory Chinese Academy of Sciences

摘　　要：上海天文台1.56m反射望远镜自2002年起安装了两架相同的CCD照相机,#1和#2。所用芯片都是Tek2048×2048。它们系在Lick天文台使用其控制电路组装。自2004年起,#1 CCD发生了一种非常奇怪的退变,在其芯片上有许多小的区域的灵敏度下降,并呈现非线性(<3%)。这些小区域的数目自2004年起逐年增加(现已基本稳定)。这种奇怪的退变只发生在I波段,B,V,R波段都不受影响,也就是说,只涉及近红外光子。该现象在"CCD World"网页报道后引起注意,进行过许多讨论。这是整个CCD领域中未知的一种新毛病,但是找不出其病因。#2 CCD没有这种退变。The CCD #1 camera has been attached to the 1.56-m reflector of Shanghai Observatory since 2002. It has suffered from a kind of strange deterioration since 2004: there are many local subregions on the CCD chip where the sensitivity has decreased and the non-linearity (< 3%) appeared. The number of these local subregions has increased since 2004. But the deterioration only appears in I,not in B,V and R. That is to say,only the near-infrared photons are involved,so it is a kind of new fault of CCD which is unknown to the whole CCD world.

关 键 词：仪器 检测器 CCD 技术 测光 

分 类 号：TN3[电子电信—物理电子学]