X射线RoHS荧光分析基体效应吸收校正的MCNP模拟  

Absorption Calibration of Matrix Effect in X-ray RoHS Fluorescence Analysis Using MCNP Simulation

作　　者：谈春明[1] 

机构地区：[1]清华大学核能与新能源技术研究院,北京100084

出　　处：《原子能科学技术》2012年第11期1372-1376,共5页Atomic Energy Science and Technology

基　　金：国家自然科学基金资助项目(10805032)

摘　　要：采用MCNP程序模拟RoHS元素荧光分析受基体材料和射线能量的影响。在低浓度RoHS分析中强度和浓度近似为线性关系,不同基体下直线斜率差别很大。对镉的计算表明,荧光强度的差异主要受吸收系数的影响,严重时达两个量级。为改善浓度测量的准确度,引入吸收系数影响因子对荧光强度进行校正,使用同一种标样刻度,可克服不同基体中浓度转换系数变化的影响。MCNP simulation was utilized to study the effects of substrate materials and X-ray energy on X-ray RoHS fluorescence analysis. The linear relationship between signal intensity and concentration was well maintained for low concentration, while slopes were significantly different in presence of different substrates. The simulation results of Cd element indicate that the absorption coefficient can influence the fluorescence intensity by up to two orders of magnitude. Therefore, the absorption calibration factor of fluorescence intensity was introduced to improve the accuracy of the concentration measurement. Then, one calibration standard can be used for different substrates by overcoming variation of concentration conversion data.

关 键 词：X射线荧光分析 基体效应 ROHS MCNP 

分 类 号：O657.34[理学—分析化学]