金属铜对MH-Ni电池微短路的影响  

Influence of copper on the micro short circuit of Ni-MH battery

作　　者：宰云肖 韩建崴 李源 赖新暖 段秋生 

机构地区：[1]中山中炬森莱高技术有限公司,广东中山528437

出　　处：《电池工业》2012年第2期78-80,共3页Chinese Battery Industry

摘　　要：通过分别对MH-Ni电池正极、负极、电解液添加铜粉制成试验电池,进行120A放电、40℃搁置7天、常温搁置30天、常温搁置500天的测试,研究金属铜对MH-Ni电池微短路的影响。研究结果表明,电池正极中含有金属铜对MH-Ni电池的微短路贡献最大,其他各组分含有金属铜也会增大MH-Ni电池微短路的机会。The influence of copper on micro-short-circuit of Ni-MH batteries by adding copper power in the positive plate,negative plate and electrolyte was studied in this paper.The performance of Ni-MH sample batteries,including 120A discharge,shelved at 40 ℃ for 7 days,shelved at room temperature for 30 days and shelved at room temperature for 500 days,was tested.The results showed that the copper of positive plate most likely caused the micro-short-circuit,and the copper of other components would also increase the opportunities of micro-short-circuit.

关 键 词：MH-NI电池 自放电 微短路 

分 类 号：TM912[电气工程—电力电子与电力传动]