利用GMI效应表征FeCuNbSiB薄带的磁结构  

Characterization of the Magnetic Structure of FeCuNbSiB Ribbon by GMI Effect

作　　者：范晓珍[1] 方允樟[2] 

机构地区：[1]浙江师范大学数理与信息工程学院,浙江金华321004 [2]浙江师范大学LED芯片研究中心,浙江金华321004

出　　处：《长春大学学报》2013年第2期176-179,共4页Journal of Changchun University

基　　金：国家自然科学基金资助项目(50871104)

摘　　要：介绍了利用GMI效应表征540℃加不同加张应力退火的FeCuNbSiB薄带的磁结构,并结合磁力显微镜观测法进行分析。实验结果表明:该样品具有横向易磁化结构和纵向易磁化结构的复合结构,随着应力的增大,横向各向异性场呈线性增大,这跟其他研究者的研究结果相一致。采用GMI效应表征软磁材料磁结构的方法是传统磁结构表征方法的一个有益补充。The article describes the magnetic structure of FeCuNbSiB ribbon characterized by GMI effect under different tensile stress anneal at 540℃,and makes an analysis combined with magnetic force microscope observation method.The experimental results show that the sample has a composite structure of transverse easy magnetic structure and longitudinal easy magnetic structure,and the transverse anisotropy field increases linearly with the increase of the tensile stress,which is consistent with the findings of other researchers.The method of characterizing magnetic structure of soft magnetic material by GMI effect is a useful complement to traditional magnetic structure characterization methods.

关 键 词：GMI效应 磁结构 磁力显微镜法 

分 类 号：N[自然科学总论]