Research on Stress Wave Tomography of Spruce Logs with Artificial Defects under Different Number Sensors  

作　　者：Chen Yongping Liu Xiuying Li Hua Han Yang Li Dongqing Zhang Tao 

机构地区：[1]Key Laboratory of Wood Science and Technology of State Forestry Administration,Research Institute of Wood Industry,Chinese Academy of Forestry [2]Beijing Research Institute of Architectural Heritages

出　　处：《Chinese Forestry Science and Technology》2012年第3期71-72,共2页中国林业科技（英文版）

摘　　要：In order to raise the precision of stress wave imaging technology(SWIT),under the conditions of different area and outline of simulated cavity defects in timber discs of spruce,different number of used sensors,the relationship between imaging graph defects and real defects is studied. The result shows:SWIT can display graph of defects,the precision of imaging graph relates to rate of real defect area and area of the tested wood cross section,the number of used sensors and outline shape of the defects.When the rate rises from 1.6% to 25.0%,the relative error of graph defect area and real defect area drops from 22.6%to 9.7%.When the number of used sensors is from 6 to 24,the graph of SWIT can show the existence of real defect. But the number of sensors used influences the precision of SWIT.Outline shape of defects has certain effect on detection of defects.Under the condition of the same defect area,the defects of long and narrow shape are easy to be shown by graph.The relation error of defect area of suborbicular shape is smaller than that of long and narrow shape.In order to raise the precision of stress wave imaging technology(SWIT),under the conditions of different area and outline of simulated cavity defects in timber discs of spruce,different number of used sensors,the relationship between imaging graph defects and real defects is studied. The result shows:SWIT can display graph of defects,the precision of imaging graph relates to rate of real defect area and area of the tested wood cross section,the number of used sensors and outline shape of the defects.When the rate rises from 1.6% to 25.0%,the relative error of graph defect area and real defect area drops from 22.6%to 9.7%.When the number of used sensors is from 6 to 24,the graph of SWIT can show the existence of real defect. But the number of sensors used influences the precision of SWIT.Outline shape of defects has certain effect on detection of defects.Under the condition of the same defect area,the defects of long and narrow shape are easy to be shown by graph.The relation error of defect area of suborbicular shape is smaller than that of long and narrow shape.

关 键 词：stress wave imaging technology precision RELATIVE ERROR DEFECT sensor 

分 类 号：S7[农业科学—林学]