Pattern recognition of typical defects in high-voltage storage capacitors based on DC partial discharge  被引量:1

Pattern recognition of typical defects in high-voltage storage capacitors based on DC partial discharge

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作  者:WU GuangNing BIAN ShanShan ZHOU LiRen ZHANG XueQin RAN HanZheng YU ChengLong 

机构地区:[1]School of Electrical Engineering,Southwest Jiaotong University,Chengdu 610031,China [2]Mailbox919-518,Mianyang 621900,China

出  处:《Science China(Technological Sciences)》2009年第12期3729-3735,共7页中国科学(技术科学英文版)

基  金:Supported by the National Natural Science Foundation of China(Grant No.10476022);Doctoral Innovation Fund of Southwest Jiaotong University

摘  要:High-voltage storage capacitors(hereinafter call capacitors for short)have been widely used in pulsed power technology.In accordance with the actual work conditions of capacitors,direct current partial discharge(DCPD)detection was put forward.The whole test system was based on the impedance balance circuit characterized by good configuration and anti-interference ability.Through DCPD detection on capacitors which contained four typical defects respectively,test results revealed that DCPD signals could well reflect the state of capacitor insulation.DCPD distribution spectra of capacitors containing four typical defects were obviously different.Defects in capacitors could be exactly judged by computer–aided pattern recognition based on support vector machine(SVM).High-voltage storage capacitors (hereinafter call capacitors for short) have been widely used in pulsed power technology. In accordance with the actual work conditions of capacitors, direct current partial discharge (DCPD) detection was put forward. The whole test system was based on the impedance balance circuit characterized by good configuration and anti-interference ability. Through DCPD detection on capacitors which contained four typical defects respectively, test results revealed that DCPD signals could well reflect the state of capacitor insulation. DCPD distribution spectra of capacitors containing four typical defects were obviously different. Defects in capacitors could be exactly judged by computer-aided pattern recognition based on support vector machine (SVM).

关 键 词:high VOLTAGE storage CAPACITOR PARTIAL DISCHARGE composite INSULATION DC pattern recognition 

分 类 号:TM53[电气工程—电器]

 

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