Application of Ultra-High Resolution STXM-NEXAFS and Nano-SIMS on the Mapping of Carbon Related Samples  

作　　者：LIANG Bi-qing(Institute of Earth Sciences,Academia Sinica,Taipei 11129,Taiwan) 

出　　处：《矿物学报》2011年第S1期1010-1010,共1页Acta Mineralogica Sinica

摘　　要：Nano-Scale mapping of minerals and organic compounds give unprecedented high resolution information on the origin and nature of substances,and provide new insight on their correlative distribution and interaction,thus present a powerful tool to study the progressive changes of geological samples,and may even be applied to study extraterrestrial samples in search of life.One example we present here explore the use of elemental microprobe,X-Ray Photon Spectroscopy(XPS),and synchrotron-based Scanning Transmission X-ray Microscopy(STXM) coupled with Near Edge X-ray Absorption Fine Structure(NEXAFS) Spectroscopy to investigate the surface properties and stability of micron-size organic carbonaceous particles from Central Amazon,Brazil,specifically focusing on black carbon in Kaolinitic Oxisol originated from anthropogenic processes,and their interaction with cations.

关 键 词：SIMS Application of Ultra-High Resolution STXM-NEXAFS and Nano-SIMS on the Mapping of Carbon Related Samples 

分 类 号：P57[天文地球—矿物学]