一种测量纳米材料高频特性的新方法  

A novel method to measure the high-frequency properties of nanomaterials

作　　者：王艳新[1] 杨勇[1] 裴东斐[2] 赵昕[3] 许胜勇[1] 

机构地区：[1]纳米器件物理与化学教育部重点实验室北京大学电子学系 [2]北京大学元培学院 [3]北京大学物理学院

出　　处：《电子测量与仪器学报》2009年第S1期10-14,共5页Journal of Electronic Measurement and Instrumentation

基　　金：国家科技部(项目编号2006CB932401);国家自然科学基金(项目编号10774002)的资助

摘　　要：本文介绍一种使用同轴线制备简易高频测试平台、运用射频设备测量纳米尺度样品高频性能的方法。使用该方法,窄脉冲射频信号在传输线中的延时测量精度达到10皮秒左右,发现了铜芯同轴传输线与多壁碳管同轴传输线的传输特性的区别。这一方法有可能推广到测试其他小尺度样品高频特性的研究中。In this paper we introduce a novel method to measure the high-frequency properties of nanomaterials with commercial radio-frequency instruments and sample stages made of coaxial cables.By using this method,we have achieved a time-resolution about 10 pico-second in measurements of pulse-delay in various transmission lines.We have found the difference in delay time, signal distortion and attenuation between copper wires and multi-walled carbon nanotube bundles when they are both served as the cores of coaxial cables for transmission of nano-second pulses.This method has a potential to be applied in high-frequency studies of other nanomaterials.

关 键 词：射频 高频特性 同轴线 

分 类 号：TB383.1[一般工业技术—材料科学与工程]