X光衍射实验的改进与校正  

Amelioration of X-ray diffraction experiment

作　　者：罗来龙[1] 

机构地区：[1]武汉理工大学理学院,湖北武汉430063

出　　处：《物理实验》2004年第6期8-9,共2页Physics Experimentation

摘　　要：用X射线衍射仪做定量分析衍射实验 ,会出现因盖革计数器存在分辨时间而漏计的现象 .为了简便地测定分辨时间 ,本文利用单层膜二次照射技术 ,导出了用来校正积分强度的近似公式 ,并与逐点校正法作了对比分析 。In quantitative analysis of diffraction experiment by X ray diffraction meter,resolving time of Geiger counter would result in metrical omitting. In order to measure the resolving time, the method of double irradiation on monolayer film is given, and the approximate expression to correct integrated intensity is derived. The results are in perfect accordance with point to point emendation.

关 键 词：X射线 衍射 分辨时间 积分强度 

分 类 号：O434.1[机械工程—光学工程]