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作 者:石东奇 杨秉川 王小平 华志强 李文祥 常世安 袁冠森 郝建民
出 处:《Rare Metals》1996年第3期161-164,共4页稀有金属(英文版)
摘 要:Yttria-stabilized zirconia (YSZ) thin films with the c-axis texturing were successfully deposited onpolycrystalline metallic tape (Hastelloy-C) by a dc bias rf magnetron sputtering. X-ray measurements re-vealed that the resulting YSZ films exhibited pure c-axis texturing. YBCO films deposited by using demaguetron sputtering on Hastelloy tape with YSZ buffer layer were c-axis oriented with △ω(FWHM of apeak in the rocking curve) = 5. 9° . T_c_o of 91 K and J_c of 2. 0 × 10 ̄3 A/cm ̄2(77 K, OT) were obtained.Yttria-stabilized zirconia (YSZ) thin films with the c-axis texturing were successfully deposited onpolycrystalline metallic tape (Hastelloy-C) by a dc bias rf magnetron sputtering. X-ray measurements re-vealed that the resulting YSZ films exhibited pure c-axis texturing. YBCO films deposited by using demaguetron sputtering on Hastelloy tape with YSZ buffer layer were c-axis oriented with △ω(FWHM of apeak in the rocking curve) = 5. 9° . T_c_o of 91 K and J_c of 2. 0 × 10 ̄3 A/cm ̄2(77 K, OT) were obtained.
关 键 词:YSZ buffer layer Hastelloy-C tape dc bias sputtering
分 类 号:TN305[电子电信—物理电子学]
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