薄层反射频谱随入射角的变化  

CHANGE IN SPECTRUMS OF THIN LAYERS WITH INCIDENT ANGLES

作　　者：雷晓[1] 杨凯[1] 叶林 

机构地区：[1]西南石油学院勘探系 [2]四川石油局地调处

出　　处：《西南石油大学学报（自然科学版）》1992年第4期15-22,共8页Journal of Southwest Petroleum University(Science & Technology Edition)

摘　　要：本文计算了薄层模型上不同入射角对应的反射频谱。本文比较了不同速度比,不同泊松比和不同厚度薄层的频谱响应之后,指出频域具有类似时域的AVO特性,而差异调谐是薄层反射频谱随入射角变化的重要因素,提出用频谱极值和极值频率作为分析频谱随入射角变化的特征参量。In this paper we calculated the reflection spectrums corresponding to different incident angles on a thin layer mould, and compared the spectrums which response to different velocity ratios, Poison's ratios and layer thicknesses. We also showed that the AVO characters in frequency domain are similar to those in time domain, and differential tuning is the main factor affecting spectrum-versus-offset. We proposed that we should use spectrum extremum and extremun frequency as characteristic parameters in spectrum-versus-offset.

关 键 词：频谱 薄层 差异调谐 频谱极值 极值频率 

分 类 号：P631.4[天文地球—地质矿产勘探]