METHOD OF PARAMETER STATISTICAL ANALYSIS FOR BIPOLAR INTEGRATED CIRCUIT DESIGN  

作　　者：郝跃 过润秋 

机构地区：[1]Xidian University

出　　处：《Journal of Electronics(China)》1991年第4期373-377,共5页电子科学学刊（英文版）

摘　　要：The method and procedure of realizing parameter statistical correlation analysis ofbipolar analog IC’s are given,and the statistical model of parameter are constructed with doubleparameters(B_F,R_S).Based on the comparison and analysis of the circuit characteristics,it isshown that the method can be used for analysis and design of bipolar IC’s.The method and procedure of realizing parameter statistical correlation analysis of bipolar analog IC's are given,and the statistical model of parameter are constructed with double parameters(B_F,R_S).Based on the comparison and analysis of the circuit characteristics,it is shown that the method can be used for analysis and design of bipolar IC's.

关 键 词：ANALOG integrated CIRCUIT PARAMETER STATISTICAL ANALYSIS Correlation ANALYSIS 

分 类 号：TN01[电子电信—物理电子学]