1.0MeV电子碰撞引起Ta和Au内壳电离截面的测量  

K-shell and L-shell Ionization Cross Sections of Ta and Au induced by 1.0 MeV Electron

作　　者：张检明[1,2] 邵曹杰[1,2,3] 卢荣春[1] 于得洋[1] 张月昭 王伟[1,2,3] 刘俊亮[1] 蔡晓红[1] 

机构地区：[1]中国科学院近代物理研究所,兰州730000 [2]中国科学院大学,北京100049 [3]兰州大学核科学与技术学院,兰州730000

出　　处：《原子核物理评论》2015年第2期254-257,共4页Nuclear Physics Review

基　　金：国家重点基础研究发展计划项目(973计划)资助项目(2010CB832901);国家自然科学基金资助项目(11179017;11105201)~~

摘　　要：无论对深入理解电子-原子的作用机制,还是在材料等领域的实际应用,电子轰击原子的内壳电离截面都具有重要意义。当前电子碰撞引起原子内壳电离的实验数据多集中在几十ke V入射能量和中小Z靶原子,其它数据相对比较缺乏。本工作以能量为1.0 Me V电子轰击Ta和Au靶,通过测量靶原子特征X射线的产额,获得其K壳电离截面分别为13.3和10.1 b,L壳电离截面分别为554和338 b。并将实验结果和相应的理论进行了对比,结果显示,本实验测得的K壳电离截面与Casnati、Hombourger理论值、L壳电离截面与Scofield和Born-Bethe的理论值相符。Accurate experimental data for atomic inner-shell ionization cross-sections by electrons are of basic importance both in understanding inelastic electron-atom interaction and its application. Up to now, most of available data on this process were mainly concentrated on the low and medium Z atoms by the bombardment of low energy electrons. In present experiments K-shell and L-shell ionization cross-sections of Ta and Au in collisions with 1.0 Me V eleltron were determined by measuring the characteristic X-rays emitted from the target atoms. For the present collision systems the K-shell ionization cross-sections were found to be 13.3 and 10.1 b,and the L-shell ionization cross sections were 554 and 338 b, respectively. The measured K-shell ionization cross sections are in reasonable agreement with the theoretic predictions of Casnati and Hombourger, while L-shell ionization cross sections are consistent with the theoretical results of Socfield and Born-Bethey.

关 键 词：电子碰撞 内壳电离 电离截面 

分 类 号：O562.5[理学—原子与分子物理]