组合电路SET传播特性与软错误率分析  

Single Event Transient Propagation and Soft Error Rate Analysis for Combinational Logic

作　　者：靳丽娜[1] 廖家轩[1] 周婉婷[1] 李磊[1] 

机构地区：[1]电子科技大学电子科学技术研究院,四川成都610054

出　　处：《微电子学与计算机》2015年第5期130-133,共4页Microelectronics & Computer

摘　　要：通过研究单粒子瞬态(Single Event Transient,SET)在逻辑链路中的传输,表明输入脉冲宽度对脉冲在传输过程中的展宽和衰减有重要影响.在辐照环境下,采用SET的传输模型和软错误率的分析模型评估软错误率.基于这两种模型,从门级角度对组合电路的软错误率分析进行了改善,使得软错误率评估方法得到改进.由于电气掩蔽效应对软错误分析具有重要的影响,在运用SET传输模型中考虑了电气掩蔽特性.Single event transient(SET)propagation in logic chains is studied,and it is shown that the pulse width has a major impact on broadening or attenuation of SET.Using SET propagation model and soft error rate(SER)analysis model to validate SER,on the basis of the two models,the method of SER at the gate level for combinatorial logic is improved,evaluation method for SER in combinational circuits to radiation is developed.Electrical masking effect has a significant influence on SER,using transient propagation model concerned electrical masking effect.

关 键 词：单粒子瞬态 软错误率 SET传输 组合逻辑 

分 类 号：TN791[电子电信—电路与系统]