Bi系银夹板厚膜传输临界电流密度的各向异性研究  

Study on Anisotropy of Transport Critical Current Density of Bi-based Silver Clamped Thick Film

作　　者：王智河[1] 韩汉民[1] 王玉贵[1] 王顺喜[1] 韩谷昌 

机构地区：[1]中国科学院等离子体物理研究所,合肥230031

出　　处：《低温与超导》1993年第4期6-12,共7页Cryogenics and Superconductivity

摘　　要：测量了名义组分为Bi_(1.8)Pb_(0.4)Sr_2Ca_2Cu_3O_y银夹板厚膜在外加磁场H与厚膜表面成不同角度情况下的传输临界电流密度Jc和H的关系。实验结果表明.临界电流密度Jc受外加磁场的影响,明显地表现出各向异性,且各向异性因子随磁场的变化而变化.这种现象与样品中的弱连接以及样品对磁通线的钉扎力密度F_p有关。经过三次烧结和多次重复冷压制备的银夹板厚膜样品的临界电流密度达到2.2×10~4A/cm^2(77K,0T),2.8×10~3A/cm^2(77K,1T),77K下磁场超过4T,无阻电流消失。The dependence of transport critical current density Jc on magnetic field H at different angles between the magnetic field and the surface of silver clamped thick film with nominal composition Bi1.8Pb0.4Sr2Ca2Cu3Oy was measured.The experimental results indicate that owing to the influence of applied magnetic fields,critical current density J shows anisotropy obviously.Anisotropy factors change with the increasing of the magnetic field.This phenomenon relates to weak link junction and flux lines pinning force density Fp of the sample.For the sample of silver clamped thick film which was sintered 3 times and cool-pressed many times,the critical current density was 2.2×104A/cm2 at 77.3K and zero magnetic field;at H =1T,Jc = 2.8×103A/cm2;when H exceeds 4T,supercurrent disappeared.

关 键 词：超导体 各向异性 临界电流密度 

分 类 号：TM26[一般工业技术—材料科学与工程]