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作 者:蒋成勇[1] 周国清[1] 徐军[1] 邓佩珍[1] 干福熹[1]
机构地区:[1]中国科学院上海光学精密机械研究所,上海201800
出 处:《中国激光》2004年第6期669-672,共4页Chinese Journal of Lasers
摘 要:采用波长为 193nm的ArF准分子激光对钛宝石进行辐照 ,对比辐照前后的吸收光谱 ,2 18nm处的吸收增加幅度明显大于 193nm和 2 6 6nm的吸收峰。通过对不同品质因素 (FOM )值样品在 4 2 0nm处的荧光强度检测 ,发现FOM值随荧光强度减小而增大 ,对比钛宝石样品在准分子激光辐照前后的 4 2 0nm荧光谱 ,可以发现荧光强度明显降低。在检测样品的电子顺磁共振 (EPR)谱后发现 ,Ti3 + 离子的电子顺磁共振信号在辐照后强度明显增强。表明钛宝石在准分子激光辐照过程中有Ti4+ 离子向Ti3 + 离子转变趋势。Ti-doped sapphire crystals were irradiated by the argon fluoride (ArF) excimer laser. Comparing the spectra before and after irradiation, the increasing of absorption spectrum peak at 218 nm is much larger than that at 193 nm and 266 nm. Fluorescence spectra of different figure of merit (FOM) samples at 420 nm were measured, and the results indicated that fluorescence intensity decreased with increasing the FOM. The fluorescence intensity of samples at 420 nm decreased after the excimer laser irradiation. In the EPR spectrum of the Ti-doped sapphire, the intensity of the Ti 3+ signal increased after the irradiation. All results indicated that Ti 4+ ions changed to Ti 3+ ions during the irradiation of the excimer laser.
关 键 词:激光技术 钛宝石 准分子激光 吸收谱 荧光谱 电子顺磁共振谱
分 类 号:TN248.22[电子电信—物理电子学] TN244
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