用于WLAN(802.11b)基带处理器芯片组的高速ADC及DAC的测试  

Test of High Speed ADC/DAC for WLAN(802.11b) BBP Chipset

作　　者：朱海平[1] 张向民[2] 

机构地区：[1]爱德万测试(苏州)有限公司 [2]清华大学微电子研究所

出　　处：《电子工业专用设备》2004年第5期9-14,共6页Equipment for Electronic Products Manufacturing

摘　　要：简要介绍了清华大学微电子研究所设计的用于WLAN(802.11b)基带处理器芯片组的高速ADC及DAC,以及爱德万测试如何使用WVFG/WVFD实现高速ADC蛐DAC的测试。In this time, a high speed ADC and a high speed DAC have been designed by Institute of Microelectronics, Tsinghua University, which are used in the base band processor for WLAN (802.11b) chipset. Since the sampling frequency is very high, it is difficult to test these devices. ADVANTEST has successfully achieved the mixed signal ICs test with T6673(SoC test system).This paper introduces these devices and the measurement result of high speed mixed signal test.

关 键 词：WLAN 高速ADC/DAC WVFG/WVFD 混合信号测试 

分 类 号：TN407[电子电信—微电子学与固体电子学]