红外反射光谱电化学中薄层电解池效应的研究  

Thin-layer Electrolytic Cell Effect on Specular Reflectance Infrared Spectroelectrochemistry

作　　者：陈昌国[1] 黄宗卿[1] 

机构地区：[1]重庆大学化工学院,重庆630044

出　　处：《分析化学》1993年第9期1037-1039,共3页Chinese Journal of Analytical Chemistry

摘　　要：用双电位阶跃计时电流法,动电位扫描等电化学技术和红外光谱法系统测定了现场红外镜反射式电解池中的薄层厚度,电化学特性和光谱特性。结果表明,红外光谱电化学研究中的电解池存在定量的薄层电解效应。The thin-layer thickness, electrochemical and spectrometric characteristics of in situ infrared specular reflectance electrolytk cell were measured with potential scan and double step techniques and FT-IR spectrometric method. The results show that there is quantitative thin-layer electrolysis effect, in the cell of in situ infrared spectroele-ctrochemistry.

关 键 词：红外光谱 电化学 薄层电解池 

分 类 号：O657.1[理学—分析化学]