Analysis of the Spectral Resolving Power in Tomographic Imaging Spectrometry  

作　　者：方俊永 赵达尊 蒋月娟 

机构地区：[1]National Laboratory of Color Science and Engineering, Beijing Institute of Technology, Beijing100081, China

出　　处：《Journal of Beijing Institute of Technology》2004年第2期118-122,共5页北京理工大学学报（英文版）

摘　　要：From the point of view of design requirements, influence of the width of the output image of an imaging subsystem in a tomographic imaging spectrometer, namely width of the slit, the grating and the size of the CCD pixel are analyzed. For the tomographic imaging spectrometry, if the amplification ratio of the imaging subsystem is not high enough to make the whole object to be compressed within the slit, then either the slit width should be increased or the slit width kept unchanged but scanned to receive information of the object. While the width-increase method reduces the spectral resolving power and the SNR; the scanning method reduces the SNR. Analysis of the two cases and computer simulation results are given.From the point of view of design requirements, influence of the width of the output image of an imaging subsystem in a tomographic imaging spectrometer, namely width of the slit, the grating and the size of the CCD pixel are analyzed. For the tomographic imaging spectrometry, if the amplification ratio of the imaging subsystem is not high enough to make the whole object to be compressed within the slit, then either the slit width should be increased or the slit width kept unchanged but scanned to receive information of the object. While the width-increase method reduces the spectral resolving power and the SNR; the scanning method reduces the SNR. Analysis of the two cases and computer simulation results are given.

关 键 词：spectral resolving power computed-tomography (CT) imaging spectrometry SLIT CCD 

分 类 号：TH741[机械工程—光学工程]