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机构地区:[1]中国科学院空间科学与应用研究中心,北京100080
出 处:《遥感技术与应用》2004年第3期154-158,共5页Remote Sensing Technology and Application
摘 要:介绍了运用并矢Green函数和起伏逸散定理来计算平面分层媒质的辐射亮温,同时利用最小二乘法对多通道辐射计的模拟测量结果进行处理得到分层媒质厚度的方法。将该方法应用于月壤厚度的反演研究,在假定月壤如平面分层结构模型的情况下,得到了其厚度的反演结果,并对反演误差原因进行分析。The final purpose of this paper is to estimate the thickness of lunar soil. However, the thickness can't be gotten directly, so we utilize microwave radiometer to measure the lunar surface and make use of the measured values to obtain the approximate thickness. In the paper, firstly, we introduce the measuring principle of microwave radiometer that is used to measure the radiant energy of medium. For the difficulty in obtaining the radiation of inhomogeneous medium that is existent universally in nature, we divide the medium into several thin layers, and consider each layer homogeneous. Therefore, a method to calculate the brightness temperature of layered medium based on Dyadic Green's Function and Fluctuation-Dissipation theorem is recommended in the paper. At the same time, we adopt the least-square method to process the simulated data by multi-frequency microwave radiometer. On the assumption of layered structure for the lunar soil, apply this method to retrieve the thickness of the lunar soil with different measuring error. Moreover, a discussion on the inverse error is given.
关 键 词:月壤厚度反演 分层媒质 并矢Green函数 微波辐射计
分 类 号:TP79[自动化与计算机技术—检测技术与自动化装置]
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