波长色散X射线荧光光谱法对纯银中银含量的测试  

Testing of Silver Content in Silver Products by WDXRF Method

作　　者：刘斌[1] 吴奕阳[1] 陈丁滢[1] 

机构地区：[1]国家金银制品质量监督检验中心

出　　处：《上海计量测试》2004年第3期23-24,共2页Shanghai Measurement and Testing

摘　　要：应用波长色散X射线荧光光谱法(WDXRF)对纯银(银含量为99.00％～99.90％)中的银含量进行定量分析。利用国家标准物质和自行研制的工作标样建立校准曲线,采用Lachance-Trill浓度校正模式消除吸收-增强效应。对样品的测试结果与其它方法结果比较,证明方法可行。银含量99.00％≤C<99.90％时,扩展不确定度U_(90)=0.10％,V_(eff)=50。We use wavelength dispersion X-ray fluorescence spectrum method to test the silver content in silver products (silver contents is in 99.00%～99.90%). Through establishing calibration curve, better results are obtained. Comparison of the WDXRF results with that of other methods shows that the WDXRF method is a simple, fast and fairly good method for measuring silver products.

关 键 词：液长色散x射线荧光光谱法 纯银 含量测试 扩展不确定度 

分 类 号：TG115[金属学及工艺—物理冶金]