X射线ICT检测中康普顿散射效应的影响与修正  

AFFECTION OF COMPTON SCATTERING EFFECT IN X-RAY ICT AND SCATTERING CORRECTION

作　　者：彭光含[1] 杨学恒[1] 辛洪政[1] 

机构地区：[1]重庆大学数理学院,重庆400044

出　　处：《无损检测》2004年第7期336-338,共3页Nondestructive Testing

摘　　要：在X射线工业计算机层析检测(ICT)中,由于X射线与物质作用发生康普顿散射效应,有用信息连同散射光子一起进入探头形成伪影。运用康普顿散射强度方程,结合X射线与物质相互作用的特性,推出X射线ICT中的散射修正公式,并由圆形截面工件散射模型,求出圆形截面工件的具体计算积分限。从探测器探测到的总光子数中减去康普顿散射光子数,即可有效去除散射光子造成的伪影。Due to Compton scattering effect caused by the interaction of X-ray and tested material in X-ray industrial computed tomography(ICT), scattering photon entered into the detector together with useful signals and caused a false image. Combining with the characteristic of action between the X-ray and material being tested, Compton scattering intensity equation was used to derive the scattering correction equation, and also the integral boundary of round section piece was calculated on its scattering model. By subtracting the count of scattering photon from the total signals detected by detectors, the false image caused by scattering photon was wiped off effectively.

关 键 词：X射线检验 工业计算机层析技术 康普顿散射效应 散射修正 

分 类 号：TG115.28[金属学及工艺—物理冶金]