提高激光衍射图样暗纹间距测量精度的一种新方法  

A Kind of New Method of Improving Measuring Accuracy on Dark Stripe Span of Laser Diffraction Fringe

作　　者：贺国权[1] 

机构地区：[1]涪陵师范学院物理系,重庆涪陵408003

出　　处：《现代电子技术》2004年第15期106-108,共3页Modern Electronics Technique

基　　金：重庆市高校优秀骨干教师资助计划资助项目;重庆市教委科研项目

摘　　要：根据间距插值细分的理论 ,介绍用硬件电路的方法来提高激光衍射图样暗纹间距的测量精度 ,给出了电路框图和模拟实验结果。结果表明 ,在激光衍射测微中 。According to the theory of equidistance subdivision,the paper investigates that raising the measure precision of dark stripe span of laser diffraction fringe by method of hardware circuit, circuit principle and simulation experiment result for laser diffraction are presented.This simulated experiment shows that the method with the hardware equidistant subdivision can improve highly its measured accuracy in laser diffraction measure fine wire diameters.

关 键 词：激光衍射图样 暗纹间距 间距插值 固体图像传感器 

分 类 号：TG806[金属学及工艺—公差测量技术]