扫描探针显微镜与分析测量仪器的组合应用  

Developments of the application of scanning probe microscope combined with other analytical and testing instruments

作　　者：游俊富[1] 王虎[1] 赵海山[1] 

机构地区：[1]中国上海测试中心,上海200233

出　　处：《分析仪器》2004年第3期1-3,共3页Analytical Instrumentation

摘　　要：简要介绍了扫描探针显微镜与光学显微镜、扫描电子显微镜、表面分析仪器、表面增强RAMAN光谱仪、傅立叶变换红外反射吸收光谱仪。The current state respecting application of scanning probe microscope in combination with other instruments are described briefly, including optical microscope, scanning microscope, surface analysis instruments, surface enhance Raman spectrometer, Fourier transform infrared reflection absorption spectrometer, time of flight mass spectrometer and displacement systems with interferometer.

关 键 词：扫描探针显微镜 分析仪器 位移系统 组合应用 光学显微镜 扫描电子显微镜 表面分析仪器 

分 类 号：TH742[机械工程—光学工程]