高速信号眼图测试中夹具影响的校准  

Correction of the Fixture Effect on the High Speed Eye Diagram Measurement

作　　者：孙建伟[1] 张胜利[1] 王幼林[1] 谢亮[1] 祝宁华[1] 

机构地区：[1]中国科学院半导体研究所,北京100083

出　　处：《电子学报》2004年第9期1563-1565,共3页Acta Electronica Sinica

基　　金：国家"973"(No .G2 0 0 0 0 3660 1 );国家杰出青年基金 (No.6982 51 0 9)

摘　　要：为了在器件的高速信号眼图测试中去除夹具的影响 ,本文首次提出了一种利用时域和频域测量相结合 ,通过快速傅立叶变换和反变换 ,对眼图测试校准的方法 ,并进行了实验验证 .实验发现校准后眼图的张开高度、Q因子、上升时间、下降时间、峰峰抖动等参数改变明显 ,并且校准后的眼图与直接测试结果符合得很好 .To correct the fixture effect on the device used in high speed eye diagram measurement at high bit rates above Gb/s, a correction method based on time domain measurement, frequency domain measurement and fast Fourier transforms has been proposed. Under the guidance of the proposed method, experiments were designed and performed. It is found that the corrected eye diagram fits the directly measured eye diagram very well and the corrected parameters, such as eye height, Q factor, rise time, fall time and peak-to-peak jitter, are very different from the uncorrected parameters.

关 键 词：眼图 夹具 快速傅立叶变换 传输函数 

分 类 号：TN707[电子电信—电路与系统]