宣德官窑青花瓷的面扫描分析  

Plane Scan Analysis of the Surface of White and Blue Porcelain by SRXRF Method

作　　者：杨益民[1] 冯敏[1] 朱剑[1] 毛振伟[1] 王昌燧[1] 黄宇营[2] 何伟[2] 

机构地区：[1]中国科学技术大学科技史与科技考古系,安徽合肥230026 [2]中国科学院高能物理研究所,北京100039

出　　处：《光谱学与光谱分析》2004年第8期902-906,共5页Spectroscopy and Spectral Analysis

基　　金：中国科学院创新工程 (KJCX No4);国家自然科学重点基金 (1 0 1 350 50 )资助项目

摘　　要：用SRXRF对宣德时期官窑青花瓷片上的瓷彩进行面扫描分析 ,结果表明各元素分析线的峰面积有着不同的分布模式。根据与颜色浓淡、瓷彩上黄斑的耦合关系可以将K ,Cr ,Mn ,Fe,Co ,Ni,Cu ,Zn ,Hg ,Rb ,Sr,Y和Zr等 13个元素分为 3组。它可作为各个朝代青花瓷“指纹元素”的选择依据 。In this article, the authors analyze the surface of a piece of porcelain shred in Xuande Period by SRXRF, and the result shows that each peak area of elements differs in distribution pattern. According to the relationship between element peak area and color variation, and yellow fleck in glaze, it is possible to divide 13 elements, i.e. K, Cr, Mn, Fe, Co, Ni, Cu, Zn, Hg, Rb, Sr, Y and Zr, into three groups. This phenomenon will indicate how to search the 'finger elements' in each dynasty; at the same time, it will present important information for research on the forming mechanism of yellow flecks in glaze.

关 键 词：宣德官窑青花瓷 面扫描 瓷彩 指纹元素 黄斑 形成机制 无损检测 同步辐射x射线荧光分析法 

分 类 号：K876.3[历史地理—考古学及博物馆学] K854.2[历史地理—历史学]