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机构地区:[1]上海博物馆文物保护与考古科学实验室,上海200003
出 处:《文物保护与考古科学》2003年第3期13-20,共8页Sciences of Conservation and Archaeology
摘 要:随着古陶瓷科学技术分析研究的不断深入 ,不同分析技术间数据的交流和借鉴成为必然。本工作主要从技术角度分析目前国内用于古陶瓷分析研究常见的几种科学分析技术的测量偏差来源 ,并对测量分析中的相关问题进行了探讨。在针对古陶瓷样品不均匀性要求方面 ,比较了几种分析技术实验条件的选择 ,指出适合于古陶瓷分析测量束斑的大小为2 3mm。结合上博实验室EDXRF技术用于古陶瓷胎样品定量分析方法工作 ,详尽探讨了古陶瓷胎样品的原始样和粉末压片样的定量分析 ,指出古陶瓷中的“气孔效应”是造成两类样品不能公用标准样品的原因。With the development of scientific analysis techniques on ancient ceramics, the exchange and citation of the data obtained by different scientific analysis techniquse, such as PIXE, EDXRF, and SRXRF, become more practical. In this paper, the data error sources of several scientific techniques frequently used in ancient ceramic studies in China are discussed, and some related parameter models among those techniques are compared. After checking the results by using different scientific techniques with respect to relative beam size, the proper size of the beam spot is proposed as about 23mm. The effcet of 'pore in body' is proposed to be the cause that the polished body sample and the pressed sample should be analyzed separately. The quantitative analysis methods for both kinds of samples are given, based on the quantitative EDXRF analysis established in the laboratory of Shanghai Museum.
关 键 词:古陶瓷 气孔效应 X射线光谱分析技术 PIXE ED—XRF SRXRF
分 类 号:K876.3[历史地理—考古学及博物馆学] K854.2[历史地理—历史学]
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