用衰减全反射红外光谱研究纳米SiO_2粒子在复合涂层中的迁移现象  

FTIR-ATR SPECTROSCOPIC STUDY OF MIGRATION OF NANO-SiO_2 PARTICLES IN COMPOSITE COATINGS

作　　者：邱玮丽[1] 马晓华[1] 杨清河[1] 付延鲍[1] 宗祥福[1] 

机构地区：[1]复旦大学材料科学系,上海200433

出　　处：《复合材料学报》2004年第4期54-57,共4页Acta Materiae Compositae Sinica

基　　金：上海市科学技术委员会资助项目(02dz11001)

摘　　要：　用衰减全反射红外光谱(FTIR-ATR)技术研究了纳米SiO2粒子在紫外光固化复合涂层中的迁移现象,并对影响纳米SiO2粒子在涂层中分布梯度的因素进行了半定量分析。研究结果表明,纳米SiO2粒子在光固化过程中向涂层接触空气的表面迁移,在表面层富集。当纳米SiO2粒子含量较高、分子量较小、接枝率较高,或者在极性较大的基体树脂中时,迁移较快,分布梯度较大。The migration phenomena of nano-SiO2 particles in UV cured composite coatings are studied by FTIR-ATR and the factors affecting the distributing gradient of nano-SiO2 particles in coating are discussed by semi-quantitative analysis. The results show that nano-SiO2 particles migrate to the surface of composite coatings. The distributing gradient of nano-SiO2 in the coating is larger when the nano-SiO2 content or its molecular weight or graft ratio or the polarity of host resin is larger.

关 键 词：衰减全反射红外光谱(FTIR-ATR) 纳米SIO2 紫外光固化复合涂层 

分 类 号：TB332[一般工业技术—材料科学与工程]